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Integrated 6 channels CWDM for high speed transceivers
Passband: CW±6.5nm
Insertion Loss: 1.2 dB (Premium), express 1.5 dB 1.6 dB (standard), express 2.0 dB
PDL: ≤0.30 dB
Isolation (adjacent): ≥30 dB
Isolation (Non-adjacent): ≥40 dB
Dimension: 22x13.8x6.5mm
Fiber: 250 um Corning ClearCurve Fiber, 0.6/ 0.9mm loose tube
Operating Temperature: -5 to 70℃
Storage Temperature: -40 to 85℃

Products description:

Future-Optics’ MUX/DEMUX extremely small 6 channels Coarse Wavelength Division Multiplexers are based on free-space and thin-film filter technology. It offers low insertion loss and wide pass band centered at 6ITU lambdas. The footprint is only 6.5mm*13.8mm*22mm, which is suitable to be integrated into a high speed transceiver to rely achieving high singnal rate by combining lower bit streams over 6 lambdas. The devices have been qualified per Telcordia GR-1221, GR-1209 and are ROSH compliant.

Features:

Based thin film filter technology,

free space,

Temperature independent performance;

Extramly compact and reliable

 

Applications:

Mux or Demux,

Combine/separate 6 Channels with 20nm spacing

Metro Access,

Cable TV,

WAN,

Datacom

 

Quality control:

Qualified Telcordia GR-1221, GR1209

RoHS Compliant

 

Specifications:

Optical Parameters

Specifications

Channel Plan (Wavelength nm)

1271-1611nm 20 nm spacing, any 6 channels with extra port for express or bonus channel

Passband (0.5 dB)

CW±6.5nm

Insertion Loss (dB)

1.2 dB (Premium), express 1.5 dB
1.6 dB (standard), express 2.0 dB

Polarization Dependent Loss (dB)

≤0.3

Adjacent Channel Isolation (dB)

≥30

Non-Adjacent Channel Isolation (dB)

≥40

Mechanical

 

Dimension (mm)

22x13.8x6.5

Fiber

250 um Corning ClearCurve  Fiber, 0.6/ 0.9mm loose tube

Environmental

 

Operating Temperature Range (°C)

-5 to 70

Storage Temperature (°C)

-40 to 85

 

production line

    

    

product test

 

                                                                                                vibration test

 

                                                                                            temperature test

 

                                                                                               spectrum test

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Copyright(C)2009-2014 Future Optics Sci. & Tech. Co., Ltd
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