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Integrated 16 channels CWDM for high speed transceivers
Wavelength: 1271 to 1611nm (20nm channel spacing)
Passband: CW±6.5nm
Insertion Loss: Maximum 2.8 (Standard) with uniformity<1.0
PDL: ≤0.30 dB
Isolation (Adjacent): ≥30 dB
Isolation (Non-Adjacent): ≥40 dB
Dimension: 6x12x25 mm
Fiber: 250 um Corning ClearCurve Fiber, 0.9mm or 0.6mmloose tube
Operating Temperature: -5 to 70℃
Storage Temperature: -40 to 85℃

Products description:

Future-Optics’ MUX/DEMUX extremely small 16 channels Coarse Wavelength Division Multiplexers are based on free-space and thin-film filter technology. It offers low insertion loss and wide pass band centered at 16 ITU lambdas. The footprint is only 6x12x25 mm, which is suitable to be integrated into a high speed transceiver to rely achieving high singnal rates by combining lower bit streams over 16 lambdas. The devices have been qualified per Telcordia GR-1221, GR-1209 and are ROSH compliant.

                                             

Features:

Based thin film filter technology,

free space,

Temperature independent performance;

Extremely compact and ultra-low insertion loss

 

Qualified:

Telcordia GR-1221, GR1209

RoHS Compliant

 

Applications

To be integrated into high speed transceiver acting as Mux or Demux function 

Combine/separate 16 Channels with 20nm spacing

Metro Access,

Cable TV,

WAN,

Datacom

 

Specifications

ChannelPlan(Wavelengthnm)

1271 to 1611nm (20nm channel spacing)

Passband(0.5 dB)

CW±6.5nm

InsertionLoss (dB)

Maximum 2.8  (Standard) with uniformity<1.0

Polarization Dependent Loss (dB)

0.30

Adjacent Channel Isolation (dB)

30

Non-Adjacent Channel Isolation (dB)

40

Dimension (mm)

6x12x25mm

Fiber

250 um Corning ClearCurve  Fiber,  0.9mm or 0.6mmloose tube

Operating Temperature Range(°C)

-5 to 70

Storage Temperature(°C)

-40 to 85

 

production line

    

    

product test

 

                                                                                                vibration test

 

                                                                                            temperature test

 

                                                                                               spectrum test

 

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Copyright(C)2009-2014 Future Optics Sci. & Tech. Co., Ltd
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